Funding: -

Objectives: To expand the operational possibilities of the Energy Dispersive X-Ray Fluorescence (EDXRF) spectrometers.

Description: Currently there are two XRF spectrometers available for our research. Both instruments are laboratory built for best possible adoption to the needs of different projects. Both spectrometers are used for multi-elemental, non-destructive analysis of trace elements in the samples.

The EDXRF is based on a three axial geometry in order to reduce the background in the obtained spectra, thus reaching low detection limits. This spectrometer can be used for analysis of almost all kind of samples. The current detection limits for trace elements in aerosol samples can be found here. (Here är länk till /edxrf/index.html, under förutsättning att den här filen hamnar på /atmsci/) The geometry of the spectrometer may be further optimized and vacuum will be used in the future to further lower detection limits.

To reach even lower detection limits and be able to use very minute amounts of sample mass the Total reflection X-Ray Fluorescence (TXRF) spectrometer is used. In this spectrometer the geometry is changed so that the incoming x-rays are totally reflected on a flat sample support surface. This is achieved when the impinging angle is below a certain critical angle. The critical angle is dependent on both the reflector material and the energy of the x-rays. This optimized setup allows detection of elements in the pictogram range. By testing different materials for the reflector/sample holder and special treatments of the reflector surface for different purposes, the analysis can be improved further.

Ideas exist to develop XRF spectrometers for online analysis of small aerosol particles as well as combining the XRF instrumentation with other analytical techniques available and developed in the research group.

Staff working within this project

Johan Boman, Associate professor

Annemarie Wagner,
Researcher

Collaborators